{"id":608,"date":"2016-05-31T15:45:58","date_gmt":"2016-05-31T06:45:58","guid":{"rendered":"http:\/\/shinalab.ws.hosei.ac.jp\/wp\/?p=608"},"modified":"2021-09-24T23:22:14","modified_gmt":"2021-09-24T23:22:14","slug":"2016-ieee-international-instrumentation-and-measurement-technology-conference","status":"publish","type":"post","link":"https:\/\/shinalab.ws.hosei.ac.jp\/wp\/?p=608","title":{"rendered":"2016 IEEE International Instrumentation and Measurement Technology 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https:\/\/shinalab.ws.hosei.ac.jp\/wp\/wp-content\/uploads\/2021\/09\/2016-05-23-13.24.24.jpg 408w\" sizes=\"auto, (max-width: 300px) 100vw, 300px\" \/><\/p>\n<p>&nbsp;<\/p>\n<p>\u3053\u3053\u306f\u3001\u5343\u3068\u5343\u5c0b\u306e\u795e\u96a0\u3057\u306e\u30e2\u30c7\u30eb\u306b\u306a\u3063\u305f\u306e\u3067\u306f\u3068\u5642\u3055\u308c\u3001\u4eba\u6c17\u306e\u89b3\u5149\u5730\u3068\u306a\u3063\u305f\u300c\u4e5d\u4efd\u300d\u3067\u3059\u3002<\/p>\n<p>\uff08\u5f8c\u307b\u3069\u8abf\u3079\u305f\u3053\u308d\u3001\u5b9f\u969b\u306e\u30e2\u30c7\u30eb\u306b\u306f\u306a\u3063\u3066\u3044\u306a\u3044\u305d\u3046\u3067\u3059\u3002\uff09<\/p>\n<p>\u307e\u308b\u3067\u3001\u30b8\u30d6\u30ea\u306e\u4e16\u754c\u306b\u8ff7\u3044\u8fbc\u3093\u3067\u3057\u307e\u3063\u305f\u306e\u3067\u306f\u306a\u3044\u304b\u3068\u932f\u899a\u3057\u3066\u3057\u307e\u3046\u307b\u3069\u3001\u3059\u3070\u3089\u3057\u3044\u5834\u6240\u3067\u3057\u305f\u3002<\/p>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-medium wp-image-2718\" src=\"http:\/\/shinalab.ws.hosei.ac.jp\/wp\/wp-content\/uploads\/2021\/09\/2016-05-25-16.15.53-300x201.jpg\" alt=\"\" width=\"300\" height=\"201\" srcset=\"https:\/\/shinalab.ws.hosei.ac.jp\/wp\/wp-content\/uploads\/2021\/09\/2016-05-25-16.15.53-300x201.jpg 300w, https:\/\/shinalab.ws.hosei.ac.jp\/wp\/wp-content\/uploads\/2021\/09\/2016-05-25-16.15.53.jpg 359w\" sizes=\"auto, (max-width: 300px) 100vw, 300px\" \/><\/p>\n<p>&nbsp;<\/p>\n<p>\u300c\u6545\u5bae\u535a\u7269\u9928\u300d\u306b\u3082\u884c\u304d\u307e\u3057\u305f\u3002<\/p>\n<p>\u3055\u3059\u304c\u4e2d\u83ef\u6587\u5316\u306e\u6bbf\u5802\u3060\u3051\u3042\u308a\u5c55\u793a\u7269\u306b\u898b\u5fdc\u3048\u304c\u3042\u308a\u307e\u3057\u305f\u3057\u3001\u4e2d\u56fd\u306e\u9577\u3044\u6b74\u53f2\u3092\u77e5\u308b\u3053\u3068\u304c\u3067\u304d\u305f\u306e\u3067\u3001\u304a\u3059\u3059\u3081\u30b9\u30dd\u30c3\u30c8\u3067\u3059\u3002<\/p>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-medium wp-image-2720\" src=\"http:\/\/shinalab.ws.hosei.ac.jp\/wp\/wp-content\/uploads\/2021\/09\/2016-05-26-19.57.54-225x300.jpg\" alt=\"\" width=\"225\" height=\"300\" srcset=\"https:\/\/shinalab.ws.hosei.ac.jp\/wp\/wp-content\/uploads\/2021\/09\/2016-05-26-19.57.54-225x300.jpg 225w, https:\/\/shinalab.ws.hosei.ac.jp\/wp\/wp-content\/uploads\/2021\/09\/2016-05-26-19.57.54.jpg 306w\" sizes=\"auto, (max-width: 225px) 100vw, 225px\" 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loading=\"lazy\" decoding=\"async\" class=\"alignnone size-medium wp-image-2719\" src=\"http:\/\/shinalab.ws.hosei.ac.jp\/wp\/wp-content\/uploads\/2021\/09\/2016-05-26-18.00.05-300x225.jpg\" alt=\"\" width=\"300\" height=\"225\" srcset=\"https:\/\/shinalab.ws.hosei.ac.jp\/wp\/wp-content\/uploads\/2021\/09\/2016-05-26-18.00.05-300x225.jpg 300w, https:\/\/shinalab.ws.hosei.ac.jp\/wp\/wp-content\/uploads\/2021\/09\/2016-05-26-18.00.05.jpg 408w\" sizes=\"auto, (max-width: 300px) 100vw, 300px\" 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5\u670823~26\u65e5\u306b\u53f0\u5317\u3067\u958b\u50ac\u3055\u308c\u305f\u56fd\u969b\u4f1a\u8b702016IEEE-I2MTC\u306b\u53c2\u52a0\u3057\u3066\u304d\u305f\u306e\u3067\u5831\u544a\u3044\u305f\u3057\u307e\u3059\u3002 \u767a\u8868\u5f62\u5f0f\u306f150\u5206\u9593\u306e\u30dd\u30b9\u30bf\u30fc\u767a\u8868\u3067\u3057\u305f\u3002 \u767a\u8868\u6642\u9593\u304c\u9577\u304f\u7cbe\u795e\u7684\u306b\u3082\u8089\u4f53\u7684\u306b\u3082\u75b2\u52b4\u304c\u305f\u307e\u308a\u307e\u3057\u305f &hellip; <a href=\"https:\/\/shinalab.ws.hosei.ac.jp\/wp\/?p=608\" class=\"more-link\">\u7d9a\u304d\u3092\u8aad\u3080 <span class=\"screen-reader-text\">2016 IEEE International Instrumentation and Measurement Technology Conference<\/span> <span class=\"meta-nav\">&rarr;<\/span><\/a><\/p>\n","protected":false},"author":6,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[3],"tags":[],"class_list":["post-608","post","type-post","status-publish","format-standard","hentry","category-3"],"aioseo_notices":[],"aioseo_head":"\n\t\t<!-- All in One SEO 4.9.8 - aioseo.com -->\n\t<meta name=\"description\" content=\"M2\u306e\u79cb\u5c71\u3067\u3059\u3002 5\u670823~26\u65e5\u306b\u53f0\u5317\u3067\u958b\u50ac\u3055\u308c\u305f\u56fd\u969b\u4f1a\u8b702016IEEE-I2MTC\u306b\u53c2\u52a0\u3057\u3066\u304d\u305f\u306e\u3067\u5831\u544a\" \/>\n\t<meta name=\"robots\" content=\"max-image-preview:large\" \/>\n\t<meta name=\"author\" content=\"shinalab\"\/>\n\t<link rel=\"canonical\" href=\"https:\/\/shinalab.ws.hosei.ac.jp\/wp\/?p=608\" \/>\n\t<meta name=\"generator\" content=\"All in One SEO (AIOSEO) 4.9.8\" \/>\n\t\t<meta property=\"og:locale\" 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